M.R. Shaneyfelt: search on Z-Library

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1

The Società del 1496: Supply, Demand, and Artistic Exchange in Renaissance Perugia

Shaneyfelt, Sheri Francis

Journal:

The Art Bulletin

Year:

2015

Language:

english

File:

PDF, 3.36 MB

english, 2015

2

Proton- and Gamma-Induced Effects on Erbium-Doped Optical Fibers

Girard, S., Tortech, B., Regnier, E., Van Uffelen, M., Gusarov, A., Ouerdane, Y., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Berghmans, F., Schwank, J. R., Shaneyfelt,

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 1.10 MB

english, 2007

3

Single-Event Upsets and Distributions in Radiation-Hardened CMOS Flip-Flop Logic Chains

Dodd, Paul E., Shaneyfelt, Marty R., Flores, Richard S., Schwank, James R., Hill, Thomas A., McMorrow, Dale, Vizkelethy, Gyorgy, Swanson, Scot E., Dalton, Scott M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.43 MB

english, 2011

4

Pyramids are guides not rules: the evolution of the evidence pyramid

Shaneyfelt, Terrence

Journal:

Evidence-Based Medicine

Year:

2016

Language:

english

File:

PDF, 260 KB

english, 2016

5

Art in Italy || A Reappraisal of Giannicola Di Paolo's Early Career

Sheri Francis Shaneyfelt

Journal:

The Burlington Magazine

Year:

2007

Language:

english

File:

PDF, 1.14 MB

english, 2007

6

Effects of oxide traps, interface traps, and ââborder trapsââ on metal-oxide-semiconductor devices

Fleetwood, D. M., Winokur, P. S., Reber, R. A., Meisenheimer, T. L., Schwank, J. R., Shaneyfelt, M. R., Riewe, L. C.

Journal:

Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 2.84 MB

english, 1993

7

Test Procedures for Proton-Induced Single Event Latchup in Space Environments

Felix, James A., Schwank, James R., Shaneyfelt, Marty R., Baggio, Jacques, Paillet, Philippe, Ferlet-Cavrois, Veronique, Dodd, Paul E., Girard, Sylvain, Blackmore, Ewart W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 131 KB

english, 2008

8

Current and Future Challenges in Radiation Effects on CMOS Electronics

Dodd, P. E., Shaneyfelt, M. R., Schwank, J. R., Felix, J. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 1.35 MB

english, 2010

9

Statistical analysis of network traffic for class of service in packet-switched networks

Shaneyfelt, B.E., Wu, T.-H.

Journal:

IEEE Journal on Selected Areas in Communications

Year:

1988

Language:

english

File:

PDF, 1.04 MB

english, 1988

10

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Neutron-induced latchup in SRAMs at ground level

Dodd, P.E., Shaneyfelt, M.R., Schwank, J.R., Hash, G.L.

Year:

2003

Language:

english

File:

PDF, 367 KB

english, 2003

11

[IEEE Workshop Record 1992 IEEE Radiation Effects Data Workshop - New Orleans, LA, USA (14 July 1992)] Workshop Record 1992 IEEE Radiation Effects Data Workshop - Radiation characterization of a Monolithic nuclear event detector

Hash, G.L., Schwank, J.R., Shaneyfelt, M.R., Hughes, K.L., Connors, M.P., Swonger, J.W., van Vonno, N.W., Martin, R.L.

Year:

1992

Language:

english

File:

PDF, 366 KB

english, 1992

12

Border traps: Issues for MOS radiation response and long-term reliability

D.M. Fleetwood, M.R. Shaneyfelt, W.L. Warren, J.R. Schwank, T.L. Meisenheimer, P.S. Winokur

Journal:

Microelectronics Reliability

Year:

1995

Language:

english

File:

PDF, 1.17 MB

english, 1995

13

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Fel, N., Baggio, J., Girard, S., Duhamel, O., Melinger, J. S., Gaillardin, M., Schwank, J. R., Dodd, P. E., Shaneyfelt, M. R., Felix, J. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 927 KB

english, 2007

14

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

Dodd, P. E., Schwank, J. R., Shaneyfelt, M. R., Felix, J. A., Paillet, P., Ferlet-Cavrois, V., Baggio, J., Reed, R. A., Warren, K. M., Weller, R. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 233 KB

english, 2007

15

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Neutron-induced soft errors, latchup, and comparison of SER test methods for SRAM technologies

Dodd, P.E., Shaneyfelt, M.R., Schwank, J.R., Hash, G.L.

Year:

2002

Language:

english

File:

PDF, 315 KB

english, 2002

16

Impact of technology trends on SEU in CMOS SRAMs

Dodd, P.E., Sexton, F.W., Hash, G.L., Shaneyfelt, M.R., Draper, B.L., Farino, A.J., Flores, R.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 985 KB

english, 1996

17

[IEEE 2008 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Jyvaskyla, Finland (2008.09.10-2008.09.12)] 2008 European Conference on Radiation and Its Effects on Components and Systems - A new technique for SET pulse width measurement in chains of inverters using pulsed laser irradiation

Ferlet-Cavrois, V., McMorrow, D., Kobayashi, D., Fel, N., Melinger, J. S., Paillet, P., Pouget, V., Essely, F., Baggio, J., Girard, S., Flores, R. S., Schwank, J. R., Dodd, P. E., Shaneyfelt, M. R., H

Year:

2008

Language:

english

File:

PDF, 606 KB

english, 2008

18

Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance

King, M. P., Wu, X., Eller, M., Samavedam, S., Shaneyfelt, M. R., Silva, A. I., Draper, B. L., Rice, W. C., Meisenheimer, T. L., Felix, J. A., Zhang, E. X., Haeffner, T. D., Ball, D. R., Shetler, K. J

Journal:

IEEE Transactions on Nuclear Science

Year:

2017

Language:

english

File:

PDF, 1.15 MB

english, 2017

19

Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event Latchup

Schwank, J. R., Shaneyfelt, M. R., Baggio, J., Dodd, P. E., Felix, J. A., Ferlet-Cavrois, V., Paillet, P., Lum, G. K., Girard, S., Blackmore, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 753 KB

english, 2006

20

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Test procedures for proton-induced single event latchup in space environments

Felix, James A., Schwank, James R., Shaneyfelt, Marty R., Baggio, Jacques, Paillet, Philippe, Ferlet-Cavrois, Veronique, Dodd, Paul E., Girard, Sylvain, Blackmore, Ewart W.

Year:

2007

Language:

english

File:

PDF, 738 KB

english, 2007

21

Radiation Effects in MOS Oxides

Schwank, James R., Shaneyfelt, Marty R., Fleetwood, Daniel M., Felix, James A., Dodd, Paul E., Paillet, Philippe, Ferlet-Cavrois, VÉronique

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 1.83 MB

english, 2008

22

Effects of radiation and charge trapping on the reliability of high-κ gate dielectrics

J.A Felix, J.R Schwank, D.M Fleetwood, M.R Shaneyfelt, E.P Gusev

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 371 KB

english, 2004

23

Challenges in hardening technologies using shallow-trench isolation

Shaneyfelt, M.R., Dodd, P.E., Draper, B.L., Flores, R.S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1998

Language:

english

File:

PDF, 1.25 MB

english, 1998

24

[IEEE 2004 IEEE Radiation Effects Data Workshop - Atlanta, GA, USA (22 July 2004)] 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - Effect of passivation on the enhanced low dose rate sensitivity of National LM124 operational amplifiers

Seiler, J.E., Platteter, D.G., Dunham, G.W., Pease, R.L., Maher, M.C., Shaneyfelt, M.R.

Year:

2004

Language:

english

File:

PDF, 599 KB

english, 2004

25

2001 IEEE nuclear and space radiation effects conference (NSREC) general chairman's comments

Shaneyfelt, M.R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2001

Language:

english

File:

PDF, 20 KB

english, 2001

26

Field dependence of interface-trap buildup in polysilicon and metal gate MOS devices

Shaneyfelt, M.R., Schwank, J.R., Fleetwood, D.M., Winokur, P.S., Hughes, K.L., Sexton, F.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

1990

Language:

english

File:

PDF, 806 KB

english, 1990

27

films

Warren, W. L., Fleetwood, D. M., Shaneyfelt, M. R., Winokur, P. S., Devine, R. A. B.

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 199 KB

english, 1994

28

Mapping of Radiation-Induced Resistance Changes and Multiple Conduction Channels in ${\rm TaO}_{\rm x}$ Memristors

Hughart, David R., Pacheco, Jose L., Lohn, Andrew J., Mickel, Patrick R., Bielejec, Edward, Vizkelethy, Gyorgy, Doyle, Barney L., Wolfley, Steven L., Dodd, Paul E., Shaneyfelt, Marty R., McLain, Micha

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 903 KB

english, 2014

29

Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Test Guideline for Proton and Heavy Ion Single-Event Effects

Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.60 MB

english, 2013

30

When is a guideline not a guideline? The devil is in the details

Cosgrove, Lisa, Shaughnessy, Allen F, Shaneyfelt, Terrence

Journal:

BMJ Evidence-Based Medicine

Year:

2018

Language:

english

File:

PDF, 231 KB

english, 2018

31

Radiation Response of a Gate-All-Around Silicon Nano-Wire Transistor

Draper, Bruce, Okandan, Murat, Shaneyfelt, Marty

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.36 MB

english, 2009

32

Non-volatile memory device based on mobile protons in SiO2 thin films

Vanheusden, K., Warren, W. L., Devine, R. A. B., Fleetwood, D. M., Schwank, J. R., Shaneyfelt, M. R., Winokur, P. S., Lemnios, Z. J.

Journal:

Year:

1997

File:

PDF, 851 KB

1997

33

Radiation Effects on Ytterbium- and Ytterbium/Erbium-Doped Double-Clad Optical Fibers

Girard, S., Ouerdane, Y., Tortech, B., Marcandella, C., Robin, T., Cadier, B., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 746 KB

english, 2009

34

Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs

J.A. Felix, J.R. Schwank, C.R. Cirba, R.D. Schrimpf, M.R. Shaneyfelt, D.M. Fleetwood, P.E. Dodd

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 503 KB

english, 2004

35

Comparison of charge yield in MOS devices for different radiation sources

Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flament, O., Blackmore, E.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 382 KB

english, 2002

36

Association of consultation between generalists and cardiologists with quality and outcomes of heart failure care

Ali Ahmed, Richard M Allman, Catarina I Kiefe, Sharina D Person, Terrence M Shaneyfelt, Richard V Sims, George Howard, James F DeLong

Journal:

American Heart Journal

Year:

2003

Language:

english

File:

PDF, 144 KB

english, 2003

37

What about family caregivers of patients with heart failure?

Susan J. Bennett, Tamilyn Bakas, Elizabeth A. Johnson, Terrence Shaneyfelt

Journal:

Journal of Cardiac Failure

Year:

2004

Language:

english

File:

PDF, 51 KB

english, 2004

38

Semi-Empirical Model for SEGR Prediction

Javanainen, Arto, Ferlet-Cavrois, Veronique, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., Virtanen, Ari

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.04 MB

english, 2013

39

Precursor ion damage and angular dependence of single event gate rupture in thin oxides

Sexton, F.W., Fleetwood, D.M., Shaneyfelt, M.R., Dodd, P.E., Hash, G.L., Schanwald, L.P., Loemker, R.A., Krisch, K.S., Green, M.L., Weir, B.E., Silverman, P.J.

Journal:

IEEE Transactions on Nuclear Science

Year:

1998

Language:

english

File:

PDF, 970 KB

english, 1998

40

[IEEE 2011 IEEE International Conference on Systems, Man and Cybernetics - SMC - Anchorage, AK, USA (2011.10.9-2011.10.12)] 2011 IEEE International Conference on Systems, Man, and Cybernetics - Quaternion based segmentation for vanilla recognition

Shaneyfelt, Ted, Agaian, Sos, Jamshidi, Mo

Year:

2011

Language:

english

File:

PDF, 1.30 MB

english, 2011

41

Resource review on: How to Read a Paper - the Basics of Evidence Based Medicine. Fourth edition. Oxford: Wiley-Blackwell 2010

Journal:

Evidence-Based Medicine

Year:

2011

Language:

english

File:

PDF, 53 KB

english, 2011

42

Reliability Implications of Defects in High Temperature Annealed Si/SiO2/Si Structures

Warren, W. L., Fleetwood, D. M., Shaneyfelt, M. R., Winokur, P. S., Devine, R. A. B., Mathiot, D., Wilson, I. H., Xu, J. B.

Journal:

MRS Proceedings

Year:

1994

Language:

english

File:

PDF, 1.06 MB

english, 1994

43

Generation of metastable electron traps in the near interfacial region of SOI buried oxides by ion implantation and their effect on device properties

J.R Schwank, D.M Fleetwood, H.D Xiong, M.R Shaneyfelt, B.L Draper

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 217 KB

english, 2004

44

Anomalous charge collection from silicon-on-insulator structures

G. Vizkelethy, P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt, D.S. Walsh, F.D. McDaniel, B.L. Doyle

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2003

Language:

english

File:

PDF, 130 KB

english, 2003

45

Enhanced MOS 1/f noise due to near-interfacial oxygen deficiency

D.M. Fleetwood, W.L. Warren, M.R. Shaneyfelt, R.A.B. Devine, John H. Scofield

Journal:

Journal of Non-Crystalline Solids

Year:

1995

Language:

english

File:

PDF, 483 KB

english, 1995

46

Heavy Ion Energy Effects in CMOS SRAMs

Dodd, P. E., Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Paillet, P., Baggio, J., Hash, G. L., Felix, J. A., Hirose, K., Saito, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 346 KB

english, 2007

47

Impact of Ion Energy and Species on Single Event Effects Analysis

Reed, R. A., Weller, R. A., Mendenhall, M. H., Lauenstein, J.-M., Warren, K. M., Pellish, J. A., Schrimpf, R. D., Sierawski, B. D., Massengill, L. W., Dodd, P. E., Shaneyfelt, M. R., Felix, J. A., Sch

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 814 KB

english, 2007

48

[IEEE 2007 IEEE International Conference on System of Systems Engineering - San Antonio, TX, USA (2007.04.16-2007.04.18)] 2007 IEEE International Conference on System of Systems Engineering - Involving Undergraduate Students in SoS Engineering

Shaneyfelt, Ted, Erdogan, Sevki

Year:

2007

Language:

english

File:

PDF, 5.66 MB

english, 2007

49

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Effects of Total Dose Irradiation on Single-Event Upset Hardness

Schwank, J. R., Shaneyfelt, M. R., Felix, J. A., Dodd, P. E., Ferlet-Cavrois, V., Paillet, P., Baggio, J., Hash, G. L., Flores, R. S., Massengill, L. W., Blackmore, E.

Year:

2005

Language:

english

File:

PDF, 6.53 MB

english, 2005

50

Electron and hole trapping in doped oxides

Warren, W.L., Shaneyfelt, M.R., Fleetwood, D.M., Winokur, P.S., Montague, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 925 KB

english, 1995

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